Nanoscale Ion Beam Lithography 8
Nevyan writes: "A group of researchers from the University of California, Berkeley are developing a device to carve patterns for microchips. They are using a method that creates a much smaller path with less distortion than traditional methods. They are trying to aim for a width of 50 nanometers for placing the maximum nuber of transistors.
http://enews.lbl.gov/Science-Articles/Archive/mask less-chips.html"
Cool (Score:1)
Re:Cool (Score:1)
This could change computing economics. (Score:3)
As there is no mask, the production of each die on the wafer will be a matter of programming. That programming can be changed on the fly, allowing for individualised integrated circuits at the same relative cost as mass-produced ones. Build one or build a million, they all have almost the same cost, even if they are all slightly different.
Applications abound: serial numbered processors (of course), processors with application-enabling software embedded directly in the microcode, on-chip encryption, processors optimised for different sets of problems, the ability to mix analog and digital circuitry on the same die, the ability to order only fifty of them at a time, all this leads to increased performance and extended use.
Consider also that it may be able to test the devices on the wafer without removing them from the manufacturing equipment. This allows for far cheaper wafer-scale integration. An entire system (chipset, if you like) is carved onto a wafer, and then tested in spot. Parts that failed are then recut in different areas of the wafer, and circuitry rerouted to the new part. Results are increased yield and a much less expensive packaging scenario, not to mention the miniaturisation gain.
Particle Size? (Score:1)
Re:Particle Size? (Score:1)
I doubt that conventional electromagnetics would apply at such small sizes though.
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Re:This could change computing economics. (Score:2)
Your idea of altering masks on the fly to route around substrate defects is pretty cool, though. My thought is that it may end up being unprofitable to do, simply because wafers may be relatively cheap enough that the time required to test and reroute is not as cost-efficient as just chucking the chip and starting over. There's also the possibility that elements will have timing constraints which would be broken by rearranging the die. Regardless, it's still a cool idea.
Nano technology (Score:1)
Not all it's cracked up to be. (Score:3)
The other problem that lies with ion beam applications is that they're even more prone to charging the wafer's surface. It's kind of like static electricity (see next paragraph), with all these ions smacking into the surface and knocking atoms away. Electrons get transferred. If the surface of the wafer is non-conductive, say... silicon dioxide, it's going to charge, and your beam is going to drift. This would be a very bad thing for ~50nm line widths. It's a very bad thing in general. Think of it as trying to spray paint something you don't have masked off in a very strong breeze. It's not going to be pretty. Like my co-workers in plating and cmp like to point out, in lithography, if we screw up, we can just strip off the resist and do it again. If you're carving out patterns with ions, you can't very well put it back.
Just a quick thing on static electricy, it's not something you want when you're trying to build semiconductors. ESD can do some pretty amazing things when you're looking on a micron or sub-micron scale. I've seen the after effects of ESD, where it melted through layers of Aluminum Oxide, Copper, and Nickle Iron. If you're building tiny transistors, ESD is something you most definitely want to stay away from. One trick we use is to dep a thin layer of gold over the wafer to distribute whatever charge builds up, but then you've got gold all over your wafer, how do you take it off? RIE or CMP it away? Sure, you could, but it's messy and time consuming.
Getting off my soapbox, ion beam "lithography" isn't in the least bit practical, and I wouldn't look for it to replace the "traditional" methods of photo and e-beam.